{"id":17686,"date":"2021-01-25T07:00:10","date_gmt":"2021-01-25T07:00:10","guid":{"rendered":"http:\/\/hilight-semi.com\/?p=17686"},"modified":"2021-01-19T17:52:31","modified_gmt":"2021-01-19T17:52:31","slug":"hilight-semiconductor-announces-installation-of-new-ultraflex-hd-next-generation-ate-test-platform-at-hilights-southampton-hq","status":"publish","type":"post","link":"http:\/\/hilight-semi.com\/zh-hans\/hilight-semiconductor-announces-installation-of-new-ultraflex-hd-next-generation-ate-test-platform-at-hilights-southampton-hq\/","title":{"rendered":"HiLight Semiconductor announces installation of new UltraFlex-HD next generation ATE test platform at HiLight\u2019s Southampton HQ"},"content":{"rendered":"<div class=\"wpb-content-wrapper\"><p>[vc_row css_animation=&#8221;&#8221; row_type=&#8221;row&#8221; use_row_as_full_screen_section=&#8221;no&#8221; type=&#8221;full_width&#8221; angled_section=&#8221;no&#8221; text_align=&#8221;left&#8221; background_image_as_pattern=&#8221;without_pattern&#8221;][vc_column][vc_column_text]HiLight Semiconductor, a world leader in CMOS integrated circuit chips for optical communications, today announced the successful installation and commissioning of an UltraFlex-HD test system from Teradyne. The new ATE test system is a significant upgrade from the current Integra-Flex tester used by HiLight, enabling at least a doubling of throughput during high-volume chip testing.<\/p>\n<p><a href=\"http:\/\/hilight-semi.com\/wp-content\/uploads\/HiLight_Press_Release_UltraFlex_ATE_Tester_JAN2021_FINAL.pdf\" target=\"_blank\" rel=\"noopener\">Click here<\/a> for the full press release.[\/vc_column_text][\/vc_column][\/vc_row]<\/p>\n<\/div>","protected":false},"excerpt":{"rendered":"<p>HiLight announced the successful installation and commissioning of an UltraFlex-HD test system from Teradyne. The new ATE test system is a significant upgrade from the current Integra-Flex tester used by HiLight, enabling at least a doubling of throughput during high-volume chip testing<\/p>\n","protected":false},"author":7,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[1],"tags":[],"class_list":["post-17686","post","type-post","status-publish","format-standard","hentry","category-uncategorized"],"_links":{"self":[{"href":"http:\/\/hilight-semi.com\/zh-hans\/wp-json\/wp\/v2\/posts\/17686","targetHints":{"allow":["GET"]}}],"collection":[{"href":"http:\/\/hilight-semi.com\/zh-hans\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"http:\/\/hilight-semi.com\/zh-hans\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"http:\/\/hilight-semi.com\/zh-hans\/wp-json\/wp\/v2\/users\/7"}],"replies":[{"embeddable":true,"href":"http:\/\/hilight-semi.com\/zh-hans\/wp-json\/wp\/v2\/comments?post=17686"}],"version-history":[{"count":7,"href":"http:\/\/hilight-semi.com\/zh-hans\/wp-json\/wp\/v2\/posts\/17686\/revisions"}],"predecessor-version":[{"id":17699,"href":"http:\/\/hilight-semi.com\/zh-hans\/wp-json\/wp\/v2\/posts\/17686\/revisions\/17699"}],"wp:attachment":[{"href":"http:\/\/hilight-semi.com\/zh-hans\/wp-json\/wp\/v2\/media?parent=17686"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"http:\/\/hilight-semi.com\/zh-hans\/wp-json\/wp\/v2\/categories?post=17686"},{"taxonomy":"post_tag","embeddable":true,"href":"http:\/\/hilight-semi.com\/zh-hans\/wp-json\/wp\/v2\/tags?post=17686"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}