HiLight Semiconductor announces installation of new UltraFlex-HD next generation ATE test platform at HiLight’s Southampton HQ
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HiLight Semiconductor announces installation of new UltraFlex-HD next generation ATE test platform at HiLight’s Southampton HQ

25 Jan HiLight Semiconductor announces installation of new UltraFlex-HD next generation ATE test platform at HiLight’s Southampton HQ

Posted at 07:00h in Uncategorized by

HiLight Semiconductor, a world leader in CMOS integrated circuit chips for optical communications, today announced the successful installation and commissioning of an UltraFlex-HD test system from Teradyne. The new ATE test system is a significant upgrade from the current Integra-Flex tester used by HiLight, enabling at least a doubling of throughput during high-volume chip testing.

Click here for the full press release.

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