HiLight Semiconductor announces installation of new UltraFlex-HD next generation ATE test platform at HiLight’s Southampton HQ
HiLight announced the successful installation and commissioning of an UltraFlex-HD test system from Teradyne. The new ATE test system is a significant upgrade from the current Integra-Flex tester used by HiLight, enabling at least a doubling of throughput during high-volume chip testing...